MIL-HDBK-115 Us Army Reverse Engineering Handbook Guidelines And ProceduresThis HANDBOOK, which provides the guidelines and procedures for performing reverse engineering, was created using current applicable laws and knowledge gained during a trial program from July 1985 to April 1987, and is based on experiences obtained from military and industry participants. This handbook is for guidance only and cannot be cited as a requirement.

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MIL-HDBK-115B(ARMY) APPENDIX D

TEST PLAN (Continued)

3.4       Test Procedure

An ATP will be prepared for the                             (nomenclature)                     . The ATP will include:  Table of Tests, Test Equipment and Test Fixtures required; specific Test Methods to accomplish the tests; and Test Data Sheets. The test methods will be a step- by-step process to be utilized to accomplish the tests required. The test data sheets will define the acceptance/rejection criteria for all test parameters as well as provisions for recording actual measurements and pass/fail notations.

3.5       Test Equipment

All test equipment used for measurements during acceptance testing will have evidence

of current calibration in compliance with the requirements of MIL-C-45662. The specific equipment and test fixtures will be listed in the ATP,  Number                      .

3.6       Equipment to be Tested

Each of the prototype units will be subjected to 100% test for all of the characteristics listed in the test data sheets of the ATP.

3.7       Classification of Defects

Departure from the limits specified in the ATP and the test data sheets are considered to be major defects. Any defect discovered during the performance of the acceptance test will result in rejection of the unit under test.

4.0       DISPOSITION OF REJECTED MATERIAL

Units which fail the requirements of the Technical Data Package (TDP) or the ATP will be evaluated and returned to the source for repair/replacement. Dependent on the nature of the failure/rejection, failure analysis and/or corrective action may be required for both the hardware and the TDP.

FIGURE 3:  Sample test plan format (see 5.10). (Page 2 of 3)

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